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2015

Atomic Force Microscopy: Biological Aspects

Author : Kate Wright

Subject : Microscopy

ISBN :9781632380593

A prominent high scale (fractions of a nanometer) measurement technique for material science - Atomic Force Microscopy (AFM), was introduced in 1980s but is now fast gaining significance in the field of

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2015

Encyclopedia of Scanning Electron Microscopy

Author : Lisa Page

Subject : Microscopy

ISBN :9781632381668

This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part

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2015

Handbook of Transmission Electron Microscopy

Author : Lisa Page

Subject : Microscopy

ISBN :9781632382832

This book compiles various research papers written by experts and scientists. It is a comprehensive summary of the various features of Transmission Electron Microscopy (TEM), from fundamental mechanisms

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2015

Key Concepts of Scanning Electron Microscopy

Author : Lisa Page

Subject : Microscopy

ISBN :9781632383068

This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various

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2015

Scanning Electron Microscopy

Author : Lisa Page

Subject : Microscopy

ISBN :9781632384065

Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques

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2015

Scanning Probe Microscopy

Author : Kate Wright

Subject : Microscopy

ISBN :9781632384072

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress

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2015

Scientific Researches in Atomic Force Microscopy

Author : Kate Wright

Subject : Microscopy

ISBN :9781632384096

This book elucidates the scientific researches in the field of atomic force microscopy. The invention of the atomic force microscope (AFM) brought about drastic changes in the field of surface analysis.

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Results 1 - 7 of 7