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Atomic Force Microscopy: Biological Aspects Author : Kate Wright Subject : Microscopy ISBN :9781632380593 A prominent high scale (fractions of a nanometer) measurement technique for material science - Atomic Force Microscopy (AFM), was introduced in 1980s but is now fast gaining significance in the field of Read More |
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Encyclopedia of Scanning Electron Microscopy Author : Lisa Page Subject : Microscopy ISBN :9781632381668 This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part Read More |
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Handbook of Transmission Electron Microscopy Author : Lisa Page Subject : Microscopy ISBN :9781632382832 This book compiles various research papers written by experts and scientists. It is a comprehensive summary of the various features of Transmission Electron Microscopy (TEM), from fundamental mechanisms Read More |
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Key Concepts of Scanning Electron Microscopy Author : Lisa Page Subject : Microscopy ISBN :9781632383068 This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various Read More |
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Author : Lisa Page Subject : Microscopy ISBN :9781632384065 Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques Read More |
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Author : Kate Wright Subject : Microscopy ISBN :9781632384072 Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress Read More |
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Scientific Researches in Atomic Force Microscopy Author : Kate Wright Subject : Microscopy ISBN :9781632384096 This book elucidates the scientific researches in the field of atomic force microscopy. The invention of the atomic force microscope (AFM) brought about drastic changes in the field of surface analysis. Read More |